Affiliation:  University of Edinburgh

Keywords: Embodied AI, Soft sensors, Machine learning, Robotic Perception

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Full profile: Dr. Yunjie Yang is an Associate Professor at The University of Edinburgh. He is also an affiliate of the Edinburgh Futures Institute (EFI), the Edinburgh Generative AI Laboratory (GAIL) fellow, and part of the Edinburgh Centre for Robotics. He was the Chancellor’s Fellow in Data Driven Innovation (2018-2023) and Bayes Innovation Fellow (2023-2024). He received his PhD in Engineering Electronics from The University of Edinburgh, MSc in Control Science & Engineering from Tsinghua University, and BEng in Measurement & Control Engineering from Anhui University. After his PhD, he briefly worked as a Postdoctoral Research Associate in Chemical Species Tomography at The University of Edinburgh before he secured the lectureship.

His research interests focus on AI-powered sensing and imaging, machine learning, soft sensors & electronics for robotics. His research has led to over 130 peer-reviewed journal and international conference publications, many of which were published in high-impact journals such as Nature portfolio journals. His research has been licensed to overseas research institutes and industry partners and received wide media coverage, including BBC, EFE, USA Today and STV. He is the awardee of the prestigious European Research Council (ERC) Starting Grant (2024).

Dr. Yang serves as the Associate Editor of IEEE Transactions on Instrumentation and Measurement, the Editorial Board Member of Scientific Reports, the Guest Editor of IEEE Sensors Journal, and the regular reviewer for over 70 high-impact international journals. He served as the track/session chair of several international conferences. He is the recipient of the 2024 IEEE J. Barry Oakes Advancement Award (For demonstrated exceptional expertise, innovation and leadership in the field of Instrumentation and Measurement), 2015 IEEE I&M Society Graduate Fellowship Award, and multiple Best Paper Awards. He is a Senior Member of IEEE, a Fellow of the International Society for Industrial Process Tomography (FISIPT), and a Fellow of the Higher Education Academy (FHEA).